产品中心

PRODUCT CENTER

YW series quartz wafer

产品简介

Quartz wafers with high transmittance, extremely low metal impurity content, and high processing accuracy can strictly control surface defects and imperfections of the material.

应用领域

TGV, DOE, PLC, AWG, etc

产品优势

Extremely low impurity content, low hydroxyl group, no bubbles, high refractive index consistency, high surface smoothness

规格参数

Product parameters


Quartz type

YW-1804

YW-1806

YW-1808

YW-1812

size

Diameter (inches)

4

6

8

12

thickness(mm)

0.05~2

0.25~5

0.3~5

0.4~5

toleranceDiameter (mm)±0.1±0.1±0.1±0.1
Thickness (mm)
CustomizableCustomizableCustomizableCustomizable
Refractive index @ three65nm1.4746981.4746981.4746981.474698
Refractive index @ 546.1nm1.4602431.4602431.4602431.460243

optical performance

Refractive index @ 1014nm

1.450423

1.450423

1.450423

1.450423

Internally throughRate (1250-1650nm)>99.9%>99.9%>99.9%>99.9%>99.9%

Transmittance (1250-1650nm)

>92%

>92%

>92%

>92%

>92%

Processing quality*

TTV(um)

<1

<3

<3

<3

Flatness(um)

≤15

≤15

≤15

≤15

Roughness(nm)

≤1

≤1

≤1

≤1

Bow(um)

<5

<5

<5

<5

physical property

Density (g/cmthree)

2.202.202.202.20
Mohs hardness7777
Young's modulus (GPa)74.2074.2074.2074.20
Shear modulus (GPa)31.2231.2231.2231.22
Poisson's ratio0.170.170.170.17
Compressive strength (GPa)1.131.131.131.13
Tensile strength (MPa)49494949
Bending strength (MPa)94.394.394.394.3

Thermal performance

Strain point (η=1014.5dPa · s) 

1070℃

1070℃

1070℃

1070℃

Annealing point (η=1013dPa · s)

1160℃

1160℃

1160℃

1160℃

Softening point (η=107.6kPa · s)

1620℃

1620℃

1620℃

1620℃

 If you have any other specification requirements, please contact sales


Metal impurity content(Unit: ppm)


Metal impurity contentLiNaKMgCaCuAlCrFeTiOH
YW series wafers≤0.001 ≤0.005≤0.005≤0.005≤0.005≤0.001 ≤0.005≤0.001≤0.001≤0.008<250